ZnO NANOMETRIC LAYERS USED IN PHOTOVOLTAIC CELLS

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dc.contributor.author Botnariuc, Vasile
dc.contributor.author Gorceac, Leonid
dc.contributor.author Coval, Andrei
dc.contributor.author Cinic, Boris
dc.contributor.author Gaugas, Petru
dc.contributor.author Chetrus, Petru
dc.contributor.author Lungu, Ion
dc.contributor.author Raevschi, Simion
dc.date.accessioned 2022-02-07T10:41:06Z
dc.date.available 2022-02-07T10:41:06Z
dc.date.issued 2020
dc.identifier.citation BOTNARIUC, Vasile, GORCEAC, Leonid, COVAL, Andrei, CINIC, Boris, GAUGASH, Petru, KETRUSH, Petru, LUNGU, Ion, RAEVSCHI, Simion. ZnO nanometric layers used in photovoltaic cells. In: IFMBE Proceedings. Ediția a 4-a, 18-21 septembrie 2019, Chişinău. Switzerland: Springer Nature Switzerland AG, 2020, pp. 53-56. ISBN 978-303031865-9. en
dc.identifier.isbn 978-303031865-9
dc.identifier.uri http://dspace.usm.md:8080/xmlui/handle/123456789/5604
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_11
dc.description.abstract The ZnO thin layers were grown on glass, InP and pInP-nCdS substrates from zinc acetate dissolved in water-acetic acid-methanol solution having a molarity of 0.2 M by using the spray method in the argon flow in the temperature range of (250–450) °C. The dependence of optical properties of ZnO layers on growth temperature have been investigated. The optical transmittance has values of 80–85% in the wavelength range of (200–1000) nm. The using of ZnO of the thickness of (60–80) nm as antireflective layers in nCdS-pInP structures allowed to increase the photovoltaic cell efficiency by 3%. The photosensitivity of the fabricated nZnO-pInP structures covers the wavelength region from 450 nm up to 1100 nm and allows the more efficient utilization of the incident light. en
dc.language.iso en en
dc.publisher Springer Nature en
dc.subject zinc oxide en
dc.subject nanometric layers en
dc.subject spraying en
dc.subject transmittance en
dc.subject photovoltaic cells en
dc.title ZnO NANOMETRIC LAYERS USED IN PHOTOVOLTAIC CELLS en
dc.type Article en


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