TEMPERATURE-DEPENDENT GROWTH AND XPS OF AG-DOPED ZNTE THIN FILMS DEPOSITED BY CLOSE SPACE SUBLIMATION METHOD

Potlog, Tamara; Duca, Dumitru; Dobromir, Marius

dc.contributor.author	Potlog, Tamara
dc.contributor.author	Dobromir, Marius
dc.contributor.author	Duca, Dumitru
dc.date.accessioned	2019-02-27T13:54:31Z
dc.date.available	2019-02-27T13:54:31Z
dc.date.issued	2015
dc.identifier.citation	POTLOG, T., DUCA, D., DOBROMIR, M. Temperature-dependent growth and XPS of Ag-doped ZnTe thin films deposited by close space sublimation method. In: Applied Surface Science. 2015, Vol. 352, p. 33-37. ISSN 0169-4332.	en
dc.identifier.issn	0169-4332
dc.identifier.uri	http://dspace.usm.md:8080/xmlui/handle/123456789/1974
dc.description.abstract	Zinc telluride (ZnTe) thin films were sublimated on a glass substrate using closed space sublimation (CSS) technique. The influence of the substrate temperature on the physical properties is studied. The deposited films were immersed in AgNO 3 solution with different concentrations, and then annealed in air. The structure and composition are studied using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). X-ray diffraction patterns of as-deposited ZnTe thin films exhibited polycrystalline behavior. The preferred orientation of (1 1 1) having cubic phase irrespective of the substrate temperature was observed. The XPS analysis confirmed the presence of Ag in the ZnTe thin films after doping by immersion in the AgNO 3 solution of different concentrations. [ABSTRACT FROM AUTHOR]	en
dc.language.iso	en	en
dc.publisher	Elsevier	en
dc.subject	ZnTe	en
dc.subject	XPS	en
dc.subject	XRD	en
dc.subject	Ag-doping	en
dc.subject	close space sublimation method	en
dc.subject	temperature effect	en
dc.subject	cristal growth	en
dc.subject	silver analysis	en
dc.subject	doping agents (Chemistry)	en
dc.title	TEMPERATURE-DEPENDENT GROWTH AND XPS OF AG-DOPED ZNTE THIN FILMS DEPOSITED BY CLOSE SPACE SUBLIMATION METHOD	en
dc.type	Article	en