Abstract:
CdS is a material whose physical properties with optoelectronic applications are influen ced by the preparation technology, especially the type of substrate and its temperatures. CdS
thin films were deposited by the CSS method on TCO (AZO, SnO2
)/Glass substrates, varying the
substrate temperature between 280-460°C and keeping the evaporation temperature constant at
630°C. Grazing Incidence X-ray Diffraction (GI-XRD) and X-ray Reflectivity (XRR), were used
for structural characterizations. The substrate temperature increase (CdS/ZnO:Al/Glass structu re) results in decrease of the microstrain values.
Description:
ROTARU, Corneliu. Particularități structurale ale formării nanostraturilor de CdS pe substraturi de ZnO și SnO2. In: Integrare prin cercetare și inovare: conferința științifică națională cu participare internațională. Ştiinţe ale naturii și exacte, 9-10 noiembrie 2023. CEP USM, 2024, pp. 698-702. ISBN 978-9975-62-690-3.
