Browsing by Author "Cuculescu, Elmira"

Browsing by Author "Cuculescu, Elmira"

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  • ELLIPSOMETRIC STUDIES OF NANOMETRIC CdS AND CdTe FILMS 
    Caraman, Mihail; Evtodiev, Igor; Cuculescu, Elmira; Rusu, Marin; Salaoru, Iurie (2005)
    The thickness of the layers CdS and CdTe grown on the Si, Ge, GaAs was determined from the analysis of the polarization ellipse of the reflected light from the surfaces of structures thin layers ...
  • UNELE PROPRIETĂŢI OPTICE ALE STRATURILOR SUBŢIRI DE GaSe ŞI GaS DOPATE CU Cu 
    Gaşin, Petru; Cuculescu, Elmira; Evtodiev, Igor; Anghel, Sergiu; Caraman, Mihail (CEP USM, 2007)
    GaS and GaSe doped with Cu thin films have been deposited by "flash" evaporation. The thickness of the layers varied from 138 to 1450 nm. The absorption spectra in the fundamental band edge region have been studied. The ...